New Flash Management drastically reduces NAND-Flash wear-out
Hyperstone’s new hyMap® technology improves endurance & random write performance for flash memory systems, thus enabling MLC for industrial embedded storage
Technology flash memory,
FTL mapping,
hyMap,
Hyperstone,
improved endurance,
industrial embedded,
MLC aware,
NAND-Flash Management,
random write performance,
reduced WAF,
write amplification factor